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Inventi Impact: VLSI

Articles

  • Inventi:evs/23758/17
    Oscillation-Based Test Applied to a Wideband CCII
    01-Jan-1970 Research 2017 : October - December
    Pablo Petrashin, Luis Toledo, Walter Lancioni, Piotr Osuch, Tinus Stander

    Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper\ninvestigates, for the first time, the application of OBT verification for second generation current conveyors (CCIIs). The OBT is\nformed by connecting theCCII into a simpleWien bridge oscillator andmonitoring both the amplitude and frequency of oscillation.\nThefault detection rate, taking into account both the open and short circuit fault simulation analyses, indicates 96.34

    How to Cite this Article
    CC Compliant Citation: Pablo Petrashin, Luis Toledo, Walter\nLancioni, Piotr Osuch, and Tinus Stander, â??Oscillation-Based Test\nApplied to a Wideband CCII,â? VLSI Design, vol. 2017, Article ID\n5075103, 6 pages, 2017. doi:10.1155/2017/5075103, http://\ncreativecommons.org/licenses/by/4.0/.
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